3D Case | Cracking the Difficulty of Small and Reflective Pin Detection
2025.01.14
Small stitches, although not eye-catching, play a crucial role in the entire production chain.
A transistor is a semiconductor device that controls current, and its pin arrangement must be consistent with the packaging, otherwise the circuit cannot function properly. Therefore, pin detection is particularly important. 0However, current 2D cameras are unable to effectively measure precise data of pins, and manual detection not only fails to meet the required accuracy, but also has low detection efficiency.
3D Detection Scheme for Line Laser Contour Measuring Instrument
How can we solve this detection problem? 0Based on the small top area of the transistor pins and the susceptibility of the metal reflective material to multiple reflected light. PHOSKEY uses the GL-8060 3D line laser profilometer with micrometer level measurement accuracy and multiple reflection elimination function. By horizontally installing the 3D camera above the workpiece, the verticality, height, and positional accuracy of the pins on both sides of the transistor are measured in real time.
Front pin to column distance detection
Select areas on the column and bottom respectively, fit two planes, calculate the surface angle, and then convert the perpendicularity to
using a formula
Front verticality detection
Select areas on the column and bottom respectively, fit two planes, calculate the surface angle, and then convert the perpendicularity to using a formula
Back Pin Inspection
Use the speckle tool to capture the contour of the pins, and control the pin position degree by calculating the distance between the pin position and the product center point
0Advantages of the plan: 0Compared to traditional manual/2D detection methods, it has higher measurement accuracy and more accurate data; Batch processing of front height and verticality, as well as back stitch position detection tasks for multiple workpieces, significantly improves detection efficiency.
— Recommended products‐
△Professional optical system, micrometer level measurement accuracy, with up to 4096 contour points
△ Ultra high speed sampling 49000 contours/second
△ Intelligent data preprocessing algorithm function
△Multiple measurement modes can be flexibly applied to achieve precise measurement of multiple detection tasks
A transistor is a semiconductor device that controls current, and its pin arrangement must be consistent with the packaging, otherwise the circuit cannot function properly. Therefore, pin detection is particularly important. 0However, current 2D cameras are unable to effectively measure precise data of pins, and manual detection not only fails to meet the required accuracy, but also has low detection efficiency.
3D Detection Scheme for Line Laser Contour Measuring Instrument
How can we solve this detection problem? 0Based on the small top area of the transistor pins and the susceptibility of the metal reflective material to multiple reflected light. PHOSKEY uses the GL-8060 3D line laser profilometer with micrometer level measurement accuracy and multiple reflection elimination function. By horizontally installing the 3D camera above the workpiece, the verticality, height, and positional accuracy of the pins on both sides of the transistor are measured in real time.
Front pin to column distance detection
Select areas on the column and bottom respectively, fit two planes, calculate the surface angle, and then convert the perpendicularity to
using a formula
Front verticality detection
Select areas on the column and bottom respectively, fit two planes, calculate the surface angle, and then convert the perpendicularity to using a formula
Back Pin Inspection
Use the speckle tool to capture the contour of the pins, and control the pin position degree by calculating the distance between the pin position and the product center point
0Advantages of the plan: 0Compared to traditional manual/2D detection methods, it has higher measurement accuracy and more accurate data; Batch processing of front height and verticality, as well as back stitch position detection tasks for multiple workpieces, significantly improves detection efficiency.
— Recommended products‐
△Professional optical system, micrometer level measurement accuracy, with up to 4096 contour points
△ Ultra high speed sampling 49000 contours/second
△ Intelligent data preprocessing algorithm function
△Multiple measurement modes can be flexibly applied to achieve precise measurement of multiple detection tasks